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Locating the sites of adsorbed species in heterogeneous catalysts: a Rietveld neutron powder profile study of xenon in zeolite-rho = Localisation des sites d'espèces adsorbées dans des catalyseurs hétérogènes: étude du profil de poudre neutronique Rietveld du xénon dans une zéolite-rhoWRIGHT, P. A; THOMAS, J. M; SUBRAMANIAM RAMDAS et al.Journal of the Chemical Society. Chemical communications. 1984, Num 20, pp 1338-1339, issn 0022-4936Article

The structure of neutral polythiophene. An application of the Rietveld methodBRUCKNER, S; PORZIO, W.Die Makromolekulare Chemie. 1988, Vol 189, Num 4, pp 961-967, issn 0025-116XArticle

Application of the Rietveld crystal structure refinement method to cellotetraoseSAKTHIVEL, A; FRENCH, A. D; ECKHARDT, B et al.A.C.S. symposium series. 1987, Num 340, pp 68-87, issn 0097-6156Conference Paper

Clathrates Ba₈{Zn, Cd}_xSi_46―x, x ∼ 7: synthesis, crystal structure and thermoelectric propertiesNASIR, N; GRYTSIV, A; MELNYCHENKO-KOBLYUK, N et al.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 38, issn 0953-8984, 385404.1-385404.8Article

R values in analysis of powder diffraction data using Rietveld refinementJANSEN, E; SCHÄFER, W; WILL, G et al.Journal of applied crystallography. 1994, Vol 27, pp 492-496, issn 0021-8898, 4Article

Crystal structure of CuBrSe₃SAKUMA, T; KANEKO, T; KURITA, T et al.Journal of the Physical Society of Japan. 1991, Vol 60, Num 5, pp 1608-1611, issn 0031-9015Article

12th European Powder Diffraction Conference (EPDIC 12), Darmstadt, Germany, August 27-30, 2010 : ProceedingsZeitschrift für Kristallographie. 2010, Vol 225, Num 12, issn 0044-2968, 85 p.Conference Proceedings

Accuracy in the quantitative phase analysis of eight- to ten-component ceramic materials using the whole-powder-pattern fitting methodsHAYASHI, S; TORAYA, H.Nippon seramikkusu kyokai gakujutsu ronbunshi. 1999, Vol 107, Num 3, pp 249-257, issn 0914-5400Article

Quantitative multiphase determination using the Rietveld method with high accuracyLIU, H; KUO, C.Materials letters (General ed.). 1996, Vol 26, Num 3, pp 171-175, issn 0167-577XArticle

A search for disorder in the spin glass double perovskites Sr₂CaReO₆ and Sr₂MgReO₆ using neutron diffraction and neutron pair distribution function analysisGREEDAN, J. E; DERAKHSHAN, Shahab; RAMEZANIPOUR, F et al.Journal of physics. Condensed matter (Print). 2011, Vol 23, Num 16, issn 0953-8984, 164213.1-164213.8Article

Spontaneous strain in Ba_0.6K_0.4BiO₃FUJISHITA, H; YAMADA, T; NAKADA, S et al.Physica. C. Superconductivity. 2010, Vol 470, Num SUP1, issn 0921-4534, S770-S771Conference Paper

Weakness of the hot spots approach to the kinetics of mechanically induced phase transformationsDELOGU, F; COCCO, G.Journal of alloys and compounds. 2008, Vol 465, Num 1-2, pp 540-546, issn 0925-8388, 7 p.Article

Thermal atomic displacements in nanocrystalline titanium dioxide studied by synchrotron x-ray diffractionNASIR KHAN, M; SHAHZAD, K; BASHIR, J et al.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 8, issn 0022-3727, 085409.1-085409.5Article

E.S.D.'s and estimated probable error obtained in rietveld refinements with local correlationsBERAR, J.-F; LELANN, P.Journal of applied crystallography. 1991, Vol 24, pp 1-5, issn 0021-8898, 5 p., p.1Article

Synthesis and X-ray structural analysis by the Rietveld method of orthorhombic hafniaOHTAKA, O; YAMANAKA, T; KUME, S et al.Nippon seramikkusu kyokai gakujutsu ronbunshi. 1991, Vol 99, Num 9, pp 826-827, issn 0914-5400Article

Crystallinity of poly(γ-hydroxybutyrate) using the Rietveld techniqueCALOS, N. J; KENNARD, C. H. L.Polymer (Guildford). 1994, Vol 35, Num 21, pp 4595-4597, issn 0032-3861Article

Structure of α-polypivalactone: a refinement based on the Rietveld methodBRUCKNER, S; MEILLE, S. V; PORZIO, W et al.Polymer (Guildford). 1988, Vol 29, Num 9, pp 1586-1589, issn 0032-3861Article

Use of the Rietveld technique for estimating cation distributions = Technique Rietveld utilisée pour estimer la répartition de cationsNORD, A. G.Journal of applied crystallography. 1984, Vol 17, Num 2, pp 55-60, issn 0021-8898Article

Short-Range Order and Dynamics in Crystalline α-TeO₂BARNEY, E. R; HANNON, A. C; HOLLAND, D et al.Journal of physical chemistry. C. 2012, Vol 116, Num 5, pp 3707-3718, issn 1932-7447, 12 p.Article

Recent developments targeting new and experienced users in EXPGUI, an open source Rietveld analysis interfaceLAKE, Charles H; TOBY, Brian H.Zeitschrift für Kristallographie. 2011, Vol 226, Num 12, pp 892-897, issn 0044-2968, 6 p.Article

X-RAY STRUCTURE DETERMINATION OF NH₄Al(SO₄)₂BOUJELBEN, Mohamed; TOUMI, Mohamed; MHIRI, Tahar et al.Annales de chimie (Paris. 1914). 2008, Vol 33, Num 5, pp 379-386, issn 0151-9107, 8 p.Article

THE ESTIMATION OF STANDARD DEVIATIONS IN POWDER DIFFRACTION RIETVELD REFINEMENTSSCOTT HG.1983; JOURNAL OF APPLIED CRYSTALLOGRAPHY; ISSN 0021-8898; DNK; DA. 1983; VOL. 16; NO 2; PP. 159-163; BIBL. 14 REF.Article

AN ALTERNATIVE TO THE RIETVELD PROFILE REFINEMENT METHOD = UNE ALTERNATIVE A LA METHODE D'AFFINEMENT DU PROFIL DE RIETVELDCOOPER MJ; ROUSE KD; SAKATA M et al.1981; Z. KIRSTALLOGR.; ISSN 0044-2968; DEU; DA. 1981; VOL. 157; NO 1-2; PP. 101-117; BIBL. 15 REF.; 10 TAB. ; TABL.Article

PROFILE SHAPE FUNCTIONS IN RIETVELD REFINEMENTSYOUNG RA; WILES DB.1982; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 4; PP. 430-438; BIBL. 35 REF.Article